Srikanth Singamaneni , Vladimir V. Tsukruk

Scanning Probe Microscopy of Soft Matter

Fundamentals and Practices

Wiley-VCH

Date de publication : 2012-01-09

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,
showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide
range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.

This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy
in soft matter research.

From the contents:

* Atomic Force Microscopy and Other Advanced Imaging Modes
* Probing of Mechanical, Thermal Chemical and Electrical Properties
* Amorphous, Poorly Ordered and Organized Polymeric Materials
* Langmuir-Blodgett and Layer-by-Layer Structures
* Multi-Component Polymer Systems and Fibers
* Colloids and Microcapsules
* Biomaterials and Biological Structures
* Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography
* Microcantilever-Based Sensors

174,02

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À propos

Éditeur
Collection
n.c
Parution
2012-01-09
Pages
661 pages
EAN papier
9783527327430

Caractéristiques détaillées - droits

EAN PDF
9783527639977
Prix
174,02 €
Nombre pages copiables
0
Nombre pages imprimables
661
Taille du fichier
15493 Ko
EAN EPUB
9783527639960
Prix
174,02 €
Nombre pages copiables
0
Nombre pages imprimables
661
Taille du fichier
38461 Ko

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