Gerhard Dehm , James M. Howe , Josef Zweck

In-situ Electron Microscopy

Applications in Physics, Chemistry and Materials Science

Wiley-VCH

Date de publication : 2012-10-10

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

165,58

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À propos

Éditeur
Collection
n.c
Parution
2012-10-10
Pages
402 pages
EAN papier
9783527319732

Caractéristiques détaillées - droits

EAN PDF
9783527652198
Prix
165,58 €
Nombre pages copiables
0
Nombre pages imprimables
402
Taille du fichier
8796 Ko
EAN EPUB
9783527652181
Prix
165,58 €
Nombre pages copiables
0
Nombre pages imprimables
402
Taille du fichier
18698 Ko

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