Téléchargez le livre :  Nanoscale Characterization of Surfaces and Interfaces

N. John Dinardo

Nanoscale Characterization of Surfaces and Interfaces

Wiley-VCH

Date de publication : 2008-09-26

Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.

Topics include:
Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale

Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information

97,01

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À propos

Éditeur
Collection
n.c
Parution
2008-09-26
Pages
173 pages
EAN papier
9783527292479

Auteur(s) du livre



Caractéristiques détaillées - droits

EAN PDF
9783527615940
Prix
97,01 €
Nombre pages copiables
0
Nombre pages imprimables
173
Taille du fichier
14868 Ko

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