Téléchargez le livre : Electron Microscopy

S. Amelinckx , Dirk Van Dyck , J. Van Landuyt , Gustaaf Van Tendeloo

Electron Microscopy

Principles and Fundamentals

Wiley-VCH

Date de publication : 2008-09-26

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.

Topics include:
* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
* Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
* Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy

Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
205,67 €

Ce livre est accessible aux handicaps Voir les informations d'accessibilité

Description du livre

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.

Topics include:
* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
* Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
* Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy

Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

À propos

Auteur
S.  Amelinckx , Dirk  van Dyck , J.  van Landuyt , Gustaaf  van Tendeloo
Éditeur
Wiley-VCH
Collection
n.c
Parution
2008-09-26
Pages
527 pages
EAN papier
9783527294794

Caractéristiques détaillées - droits

EAN PDF
9783527614554
Prix
205,67 €
Nombre pages copiables
0
Nombre pages imprimables
527
Taille du fichier
62996 Ko
Ce livre est accessible aux handicaps Voir les informations sur l'accessibilité

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