Télécharger le livre :  Conductive Atomic Force Microscopy

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists...
Editeur : Wiley-VCH
Parution : 2017-08-03

Format(s) : PDF, ePub
150,81